All Research Sponsored By:National Instruments
-
Going Parallel with LabVIEW Delivers Throughput Gains
In this whitepaper learn how by combining technologies with NI Lab VIEW parallel programming software and NI TestStand test management software, test engineers can create high-performance test systems.
-
PACs for Industrial Control, the Future of Control
This white paper explores the origins of the Programmable Automation Controllers (PAC), how PACs differ from Programmable Logic Controllers (PLC) and PCs, and the future direction of industrial control with PACs.
-
The Basics of ZigBee Transmitter Testing
Zigbee is a wireless standard for personal area network (PAN) sensor monitoring and control.
-
Advanced RFID Measurements: Basic Theory to Protocol Conformance Test
As RFID adoption continues to grow, engineers are faced with an increasing need to validate tags both for interoperability with products from other vendors and for conformance with the specified protocol.
-
GPS Receiver Testing
Today, the power of software enables you to create GPS waveforms that accurately emulate the real word signal. In addition, advances in instrument bus technology enable record and playback of live GPS signals with PXI instrumentation.
-
A Closer Look at Windows Vista
One of the stated goals of the Microsoft Windows Vista release is to greatly improve the overall security of the Windows operating system and curb the impact of malware. To this end, Microsoft redesigned both the least user and administrative...
-
Designing Next Generation Test Systems
This guide addresses challenges that pressure engineering teams to reduce the cost and time of testing, provides insight into how test managers and engineers are overcoming these challenges, and offers guidelines on building modular, software-defined...
-
NI TestStand 3.0 - Developing Automated Test Systems Faster and Smarter
Learn how TestStand 3.0 delivers continued innovation as the leading test management software among electronics manufacturers for automated prototype, validation, and manufacturing test systems.
-
National Instruments Synchronization and Memory Core - A Modern Architecture for Mixed Signal Test
By providing a common architecture for the 100 MS/s mixed-signal prototyping a test suite of instruments, the SMC enables the instruments to test systems where digital and analog signals are side by side.
-
Improving Manufacturing Quality with Integrated Test and Statistical Analysis
With test management and statistical analysis integrated into an automated system, organizations can target problem components and processes in less time with more accuracy, reducing the cost of manufacturing quality products.
-
Lowering the Cost of Test with Integrated Switch Management
National Instruments Switch Executive is a significant innovation in the design and implementation of automated test systems.
-
Strategies for Lowering the Cost of Manufacturing Test
NI platform offers high test throughput, increased productivity, and a lower cost of ownership than traditional disjoint systems or turnkey solutions based on proprietary architectures.
-
TestStand 2.0.1 – Reducing the Cost of Manufacturing Test
With TestStand, manufacturing test developers create automated test systems that dramatically reduce the cost of testing products by increasing throughput and reducing test development time.
-
NI Display Test Software Release Notes
This document lists the minimum system requirements, installation instructions, files and folders that NI Display Test installs, and technical support resources available to you.
-
TestStand 2.0 - Reducing the Cost of Manufacturing Test
National Instruments TestStand 2.0 is the latest release of the most powerful test executive software in the manufacturing test market.
-
Fuel Cell Testing - The NI Way
Fuel cells are becoming a very efficient and clean source of electrical energy for the future. Fuel cells boast many advantages when compared with conventional energy sources of today.